Optically Aligned, Space Resolving, Extreme Ultra-Violet and Soft X-ray Spectrograph

Michel Busquet, Frederic Thais, Ghita Geoffroy, Didier Raffestin, J. P. Chièze

Abstract


We describe in this paper an extreme ultra-violet/soft X-ray (XUV) spectrograph with high sensitivity, high spectral resolution and spatial resolution, which we developed to record XUV emission from a 10 J laser-irradiated gas jet. This spectrograph uses a flat field grazing incidence grating and a grazing incidence collection and imaging mirror. We designed a system where initial positions of elements can be set with a low accuracy of half a millimeter and where the final alignment is done with a visible light low intensity laser beam. High spectral resolution, good spatial resolution and nominal dispersion function have been achieved. A few illustrative results are presented.


Full Text: PDF DOI: 10.5539/apr.v5n2p25

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This work is licensed under a Creative Commons Attribution 3.0 License.

Applied Physics Research   ISSN 1916-9639 (Print)   ISSN 1916-9647 (Online)

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