Optically Aligned, Space Resolving, Extreme Ultra-Violet and Soft X-ray Spectrograph


  •  Michel Busquet    
  •  Frederic Thais    
  •  Ghita Geoffroy    
  •  Didier Raffestin    
  •  J. P. Chièze    

Abstract

We describe in this paper an extreme ultra-violet/soft X-ray (XUV) spectrograph with high sensitivity, high spectral resolution and spatial resolution, which we developed to record XUV emission from a 10 J laser-irradiated gas jet. This spectrograph uses a flat field grazing incidence grating and a grazing incidence collection and imaging mirror. We designed a system where initial positions of elements can be set with a low accuracy of half a millimeter and where the final alignment is done with a visible light low intensity laser beam. High spectral resolution, good spatial resolution and nominal dispersion function have been achieved. A few illustrative results are presented.



This work is licensed under a Creative Commons Attribution 4.0 License.
  • Issn(Print): 1916-9639
  • Issn(Onlne): 1916-9647
  • Started: 2009
  • Frequency: bimonthly

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