A Contribution to the Automatic Measurement of X-Ray Diffraction Lines

Frank Henschel, Jürgen Bauch

Abstract


In order to harness the full potential of X-ray diffraction methods, such as the high precision Kossel and X-ray Rotation Tilt (XRT) technique, a fast and automatic detection and evaluation process for digital recordings or digitized film is required. The presented method facilitates, through the implementation of largely automated processes, rapid access to a diverse evaluable database of many X-ray diffraction images. The method used for the detection of conic shaped diffraction reflection lines is composed of two parts: the rough detection of the desired image objects followed by the subsequent sub-pixel modeling of reflection lines. On the one hand the resulting database can as a whole be used for the quantitative analysis of material science-based basic phenomena with the aim of associating reflection abnormalities to crystallographic defects. On the other hand, due to the registration of the reflection fine structure, the individual data set is especially suitable for the direct calculation and output of precision residual stress tensors. For this application it is necessary to know the complete recording geometry. In this contribution we examine the focal curves for this purpose. These can also be used to evaluate electron backscatter diffraction pattern.


Full Text: PDF DOI: 10.5539/ijc.v5n2p47

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International Journal of Chemistry   ISSN 1916-9698 (Print)   1916-9701 (Online)

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